Purushotham, Kavuri P: search on Z-Library

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1

AFM characterization of nanopositioner in-plane stiffnesses

Seung Ho Yang, Yongsik Kim, Kavuri Premsagar Purushotham, Jae-Myung Yoo, Young-Man Choi, Nicholas Dagalakis

Journal:

Sensors and Actuators A: Physical

Year:

2010

Language:

english

File:

PDF, 723 KB

english, 2010

2

Nanoparticle size determination using optical microscopes

Attota, Ravikiran, Kavuri, Premsagar Purushotham, Kang, Hyeonggon, Kasica, Richard, Chen, Lei

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 937 KB

english, 2014

3

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Metrology, Inspection, and Process Control for Microlithography XXVI - Nanoparticle size and shape evaluation using the TSOM method

Damazo, Bradley, Attota, Ravikiran, Kavuri, Purushotham, Vladár, András E., Starikov, Alexander

Year:

2012

Language:

english

File:

PDF, 575 KB

english, 2012

4

Validation of Single Particle ICP-MS for Routine Measurements of Nanoparticle Size and Number Size Distribution

Montoro Bustos, Antonio R., Purushotham, Kavuri P, Possolo, Antonio, Farkas, Natalia, Vladar, Andras E, Murphy, Karen E., Winchester, Michael Ralph

Journal:

Analytical Chemistry

Year:

2018

Language:

english

File:

PDF, 794 KB

english, 2018

5

The effects of MEVVA ion implantation on the tribological properties of PVD-TiN films deposited on steel substrates

Rafael R Manory, Simon Mollica, Liam Ward, Kavuri P Purushotham, Peter Evans, Johannes Noorman, Anthony J Perry

Journal:

Surface and Coatings Technology

Year:

2002

Language:

english

File:

PDF, 150 KB

english, 2002

6

Does your SEM really tell the truth? How would you know? Part 2

Postek, Michael T., Vladár, András E., Purushotham, Kavuri P.

Journal:

Year:

2014

Language:

english

File:

PDF, 1.37 MB

english, 2014

7

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Does your SEM really tell the truth? Part 2

Postek, Michael T., Vladár, András E., Purushotham, Kavuri P., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K.

Year:

2013

Language:

english

File:

PDF, 438 KB

english, 2013

8

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, United States (Sunday 25 August 2013)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII - Nanomanufacturing concerns about measurements made in the SEM II: specimen contamination

Postek, Michael T., Vladár, András E., Purushotham, Kavuri P., Postek, Michael T., Orji, Ndubuisi George

Year:

2013

Language:

english

File:

PDF, 442 KB

english, 2013

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